Trace Element Analysis Using Edxrf with Polarized Optics

We have developed an EDXRF spectrometer with polarized optics and new quantification software which estimates non-measuring sample matrices using scattering intensities and full profile fitting method combined with FP method. Accurate analysis down to ppm level can be achieved even in complex sample composition with the quantification software. The scattering FP method corrects for non-measuring components in samples such as coal fly ash, soils and biological samples by using Compton and Thomson scattering intensities from a Mo secondary target. Additionally, it is possible to analyze thickness and composition of multi-layer thin films considering interlayer secondary excitation. INTRODUCTION Energy dispersive types of x-ray spectrometers are useful analytical tools for screening analysis, such as for environmental applications, due to compact and easy sample handling. However, the preparation of standard samples that match analyzing samples in applications such as for industrial waste and recycling raw materials often requires special attention to match sample types and preparation. This is because their sample matrices are complicated and improved sensitivities for trace elements are demanded for these environmental applications. We have developed an EDXRF spectrometer with polarized optics and software using a fundamental parameter method for accurate quantification combined with full profile fitting method, including estimating non-measuring sample matrices using scattering intensities. INSTRUMENT The specifications of the new Rigaku EDXRF spectrometer NEX CG used in this study are as follows: X-ray tube : Pd target, air cooled Tube power : 50W(50kV-2mA) Secondary targets : 5 targets (max) Detector : High performance SDD (Silicon Drift Detector) 288 Copyright ©JCPDS-International Centre for Diffraction Data 2011 ISSN 1097-0002 9